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You searched for: mediatype:texts AND collection:NISTTechNotes AND subject:"Thin Films--Optical Properties."
[texts]A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films (Volume NBS Technical Note 242) - McCrackin, Frank L.; Colson, James P.

Keywords: Thin films--Optical properties; FORTRAN (Computer program language)
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